Handheld pXRF — Mining & Mineral Analysis
Handheld pXRF analyzer with Graphene Window FAST SDD detector — bringing laboratory-quality elemental analysis to mineral exploration, geological surveys, and ore grade control. 25+ elements from Mg to U.
Core Technology
The FAST SDD detector overcomes the limits of conventional Si-PIN — delivering true laboratory quality for light elements and rare earth elements in the field.
Applications
Sample Types Supported
Technical Data
| Parameter | Value |
|---|---|
| Excitation Source | Ceramic micro-focused X-ray tube, Ag target, max 50 kV |
| Detector | Graphene Window Optimized FAST SDD (or Si-PIN option) |
| Element Range | Mg (Z=12) → U (Z=92) — 25+ elements |
| Analysis Method | Fundamental Parameters (FP) + Empirical calibration |
| Measurement Time | 1–60 seconds (matrix dependent) |
| Battery | 7.2V Li-ion, 6800 mAh — full-day field use |
| Display | Capacitive color touchscreen, daylight readable |
| Protection | Anti-puncture window, IP54 |
| Certifications | CE, RoHS |
FAQ
FAST SDD offers much lower detection limits, higher count rates, and improved peak resolution compared to Si-PIN. The difference is most significant for light elements (Mg, Al, Si) and rare earth elements.
Fundamental Parameters (FP) is a calibration approach that calculates elemental concentrations from first-principles physics without requiring physical reference standards.
More than 25 elements between Mg (Z=12) and U (Z=92). Rare earth elements (La, Ce, Pr) and critical oxides (TiO2, Fe2O3, Al2O3) are included.
The 6800 mAh Li-ion battery enables full-day field operation without access to mains power.
Quote & Information
Contact our expert team for pre-sales technical consultation, demo requests, or pricing. Over 25 years of analytical instrument experience.
